About the Beamline
The SXRMB:
Beamline Specifications
|
|
|
XAFS Endstation |
Microprobe Endstation |
Source |
|
Bending Magnet |
Bending Magnet |
Energy Range (keV) |
|
1.7 – 10 |
1.7 – 10 |
Wavelength (Å) |
|
7.3 - 1.3 |
7.3 - 1.3 |
Resolution ΔE/E @ E |
InSb (111) |
3.3 × 10-4 |
3.3 × 10-4 |
|
|
Si (111) |
1.0 × 10-4 |
1.0 × 10-4 |
Flux (g/s/0.1%BW) @ 100 mA |
|
>1.0 × 1011 |
1.0 × 109 |
Spot Size (V × H)Focusing |
|
~1 mm × 4 mmTorroidal Mirror |
~10 µm × 10µmK-B Mirror Pair |
The SXRMB has four endstations that are available to users:
Click on the headings to learn more!
Solid State Endstation
Bulk analysis of solid samples, such as pellets and powders can be performed using this endstation. Samples are placed under vacuum of 10-7 torr, optimizing flux for lower energy edges such as silicon, phosphorus, and sulfur. This endstation is equipped with fluorescence and total electron yield (TEY) detection.
Microprobe Endstation
This endstation provides a 10 × 10 μm beamspot for use in mapping experiments. Micro-xas can also be performed on specific spots using the microprobe
Ambient Table
This multi use endstation is designed for bulk analysis of many different samples. The endstation can be configured for liquid and solid in-situ experiments as well.
High Energy XPS
By setting the beamline to varying energies, x-ray photoelectrion spectroscopy (XPS) be performed at different depths on the same sample, providing information on surface and bulk properties of the material.
May 2019
Installation of glovebox-integrated XES spectrometer (easyXAFS) into the SXRMB beamline
The spectrometer was successfully installed into the inert atmosphere glovebox, and the entire system was successfully integrated into the SXRMB beamline. The technical goals of achieving X-ray emission spectroscopy measurements in the tender energy range of both phosphorus and sulfur at a resolution ~1 eV or better have been clearly demonstrated. The RIXS and higher energy capabilities (up to Ni K-edge) were also demonstrated using this system.