Schematic
The Soft X-ray Microcharacterization Beamline (SXRMB) is a medium energy X-ray beamline operating within the 1.7 to 10 keV range that is primarily suited, but not limited, for studying the main group elements such as Si, P, S, first-row transition metals as well as Ca and K.
SXRMB beamline is equipped for advanced techniques such as X-ray absorption spectroscopy (XAS), X-ray photoelectron spectroscopy (XPS), X-ray emission spectroscopy (XES), and elemental mapping using a microprobe. This beamline accommodates various sample environments, including low/high temperatures, different gas atmospheres, and in situ measurements.
The beamline enables researchers to explore the electronic and structural properties of materials across numerous applications, including the study of catalysts, batteries, environmental pollutants, biological specimens, and advanced materials.
SXRMB has two monochromator crystals available - an InSb (111) and a Si (111) crystal. For the majority of purposes, the Si (111) crystal is appropriate. If you are measuring silicon XAS, you will need to switch to the InSb (111) crystal. In some cases, the InSb (111) crystal may also improve spectra for elements on the lower end of the energy range for SXRMB because of its higher flux. Users should plan their measurements so that the samples requiring a certain crystal are grouped together to minimize switching of the crystals. I.e. measure all the silicon XAS samples at the end of your beamtime. Beamline staff will assist you with the crystal switch and subsequent optimization of the beam.
Beamline Features
- Tailored for applications requiring the challenging medium-energy range of 2-4 keV
- Vacuum compatible
- Motorized sample stages
- Automated determination of sample positions
- Capable of measuring up to 40 samples on one sample holder using double sided carbon tape
- Optimized for in-situ measurements under various conditions e.g. high/low temperature reactions or using different gasses e.g. CO, H2S/SO2, and H2
- Enable to provide both XAS and XES in-situ experiments
- Mapping in fluorescence and TEY mode with a spot size of 10 µm × 10 µm
- 500 ppm detection limit
- Capable of collecting XAS spectra under fluorescence and total electron yield (TEY), photoluminescence, and transmission mode
Beamline Specifications
| XAFS Endstation | Microprobe Endstation | |
|---|---|---|
| Source | Bending Magnet | Bending Magnet |
| Energy Range (keV) | 1.7 - 10 | 1.7 - 10 |
| Wavelength (Å) | 7.3 - 1.3 | 7.3 - 1.3 |
| Resolution ΔE/E @ E InSb (111) | 3.3 × 10⁻⁴ | 3.3 × 10⁻⁴ |
| Resolution ΔE/E @ E Si (111) | 1.0 × 10⁻⁴ | 1.0 × 10⁻⁴ |
| Flux (g/s/0.1%BW) @ 100 mA | > 1.0 × 10¹¹ | 1.0 × 10⁹ |
| Spot Size (V × H) | ~ 1 mm × 4 mm | ~10 µm × 10 µm |
| Focusing | Torroidal Mirror | K-B Mirror Pair |