Solid State Endstation
Bulk analysis of solid samples, such as pellets and powders can be performed using this endstation. Samples are placed under vacuum, optimizing flux for lower energy edges such as silicon, phosphorus, and sulfur. This endstation is equipped with fluorescence and total electron yield (TEY) detection.
Capabilities
- XAFS spectoscopy under vacuum: ~5 × 10⁻⁸ Torr
- X-Ray Fluorescence Yield (XRF)
- Total Electron Yield (TEY)
- X-ray Excited Optical Luminescence (XEOL)
- 7-element Si drift detector
Samples
- Powders
- Bulk Samples
- Foils
- Thin Films
A sample holder can hold up to 40 samples using double sided carbon tape.
Specifications
| Source | Bending Magnet |
|---|---|
| Energy Range (keV) | 1.7 - 10 |
| Wavelength (Å) | 7.3 - 1.3 |
| Resolution ΔE/E @ E InSb (111) | 3.3 × 10⁻⁴ |
| Resolution ΔE/E @ E Si (111) | 1.0 × 10⁻⁴ |
| Flux (g/s/0.1%BW) @ 100 mA | > 1.0 × 10¹¹ |
| Spot Size (V × H) | ~ 1 mm × 4 mm |
| Focusing | Torroidal Mirror |
