Glovebox-Integrated X-ray Emission Spectroscopy
X-ray emission spectroscopy (XES) probes the occupied electronic levels below the Fermi level, and serves as a complementary technique to X-ray absorption spectroscopy (XAS), offering a more comprehensive understanding of the electronic properties of materials. XES is not influenced by self-absorption effects, thus avoiding some potential experimental artifacts that can occur in fluorescence-detected XAS measurements.
XES is optimized to operate in the tender X-ray energy range of S, P, and Cl as well as transition metals (e.g. Ni and Co). Due to this unique energy range, there has been significant interest in in-situ energy and environmental studies that can benefit from X-ray emission spectroscopy (XES).
Capabilities
- XES measurements under a He atmosphere in a glovebox
- O2 content < 1 ppm
- Moisture content < 1 ppm
- Simultaneous XAS measurements using a Vortex 4-element detector
- Capable of measuring the tender energy range of both phosphorus and sulfur, with a resolution of approximately 1 eV or better
- RIXS and higher energy capabilities (up to the Ni K-edge) have been demonstrated using this system
- Available for both XAS and XES in-situ experiments
- Sample wheel motor is able to hold up to 15 samples at the same time
Schematic
For more information regarding the XES/XAS stations at the SXRMB, please refer to the following paper:
Glovebox-integrated XES and XAS stations for in-situ studies
